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Author
Vali, H.
|
Hesse, R.
|
Martin, R. F.
Title
TEM-Based Definition of 2:1 Layer Silicates and Their Interstratified Constituents.
Coporate
McGill Univ., Quebec, Canada
Journal
American Mineralogist, Vol. 79, 644-653, 1994
Keywords
silicates
|
chemical composition
|
microscopy
|
x ray diffraction
Identifiers
Transmission Electron Microscopy (TEM); High-Resolution Transmission Electron Microscopy (HRTEM)