- Author
- Vali, H. | Hesse, R. | Martin, R. F.
- Title
- TEM-Based Definition of 2:1 Layer Silicates and Their Interstratified Constituents.
- Coporate
- McGill Univ., Quebec, Canada
- Journal
- American Mineralogist, Vol. 79, 644-653, 1994
- Keywords
- silicates | chemical composition | microscopy | x ray diffraction
- Identifiers
- Transmission Electron Microscopy (TEM); High-Resolution Transmission Electron Microscopy (HRTEM)