- Author
-
Martin, J. W.
|
Nguyen, T.
|
Byrd, E.
|
Dickens, B.
|
Embree, N.
- Title
- Laboratory Apparatus and Cumulative Damage Model for Linking Field and Laboratory Exposure Results.
- Coporate
- National Institute of Standards and Technology, Gaithersburg, MD
- Book or Conf
- Service Life Prediction: Methodology and Metrologies. Proceedings. American Chemical Society Symposium Series 805. 2002,
American Chemical Society,
Martin, J. W.; Bauer, D. R., Editors,
119-143 p.,
2002
- Keywords
-
equipment
|
damage
|
laboratories
|
exposure
|
temperature
|
humidity
|
ultraviolet radiation