- Author
- Nguyen, T. | Byrd, W. E.
- Title
- In Situ Measurement of Metal Ions at the Polymer/Substrate Interface Using Infrared-Active Sensors.
- Coporate
- National Institute of Standards and Technology, Gaithersburg, MD
- Book or Conf
- Adhesion Society Meeting. February 1996, 453-455 p., 1996
- Keywords
- metal ions | sensors | polymer/substrate interface | FT-IR | in situ measurements
- Abstract
- The transport of metal ions along the polymer/steel interface is believed to be the controlling factor in the cathodic delamination of polymer-coated steel exposed to electrolytes. In situ measurement of metal ions at the polymer/substrate interface would provide critical information for understanding and modeling the delamination rate of this material. A number of techniques can be used for measuring metal ions on solid surface or in solution. However, most of these techniques are not suitable for in situ investigation at the buried polymer/substrate interface. Infrared (IR) spectroscopy in the internal reflection mode on a suitable substrate is attractive for such study because it probes the interface from the substrate side and can be used at ambient conditions.