- Author
- Bickle, L. W. | Keltner, N. R.
- Title
- Estimation of Transient Measurement Errors.
- Coporate
- L.W. Bickle and Associates, Albuquerque, NM Sandia National Labs., Albuquerque, NM
- Report
- SAND78-0497, August 1978, 174 p.
- Distribution
- AVAILABLE FROM National Technical Information Service (NTIS), Technology Administration, U.S. Department of Commerce, Springfield, VA 22161. Telephone: 1-800-553-6847 or 703-605-6000; Fax: 703-605-6900. Website: http://www.ntis.gov
- Keywords
- data analysis | time | FT-IR
- Abstract
- Accurate interpretation of data from transient experiments requires a thorough understanding of the transient response characteristic of the measurement system. In many cases, the response characteristic depends not only upon the sensor but also upon the method of mounting and the signal conditioning/recording equipment. In all transient experiments, the measurement system distorts the signal to some extent; the problem is to estimate the amount of distortion and to determine if this is acceptable. There are several methods of estimating measurement errors; these include: 1. Frequency-domain methods such as the Fast Fourier Transform and the Laplace Transform. 2. Time-domain methods, such as the Z Transform and Duhamel's Convolution Integral, that use the response of the systems to a step or impulse input (i.e., a "characteristic" response). This report shows how a time-domain convolution technique which uses the response of the system to a unit-step input as the characteristic response function can be used to estimate errors in rise time, peak amplitude; pulse width, etc., for arbitrary transient inputs. This method is a more natural way of treating transients than the more commonly used frequency-domain technique and allows users to estimate transient measurement errors in a rapid and intuitive fashion. Because of the sheer bulk of material, not every user will want to read this entire report; thus, the material is presented in modular form. The average user who is interested in a particular measurement system is advised to read Chapter 2, since that chapter summarizes how the time-domain convolution technique can be used to estimate the response of a system to arbitrary transient inputs. Chapter 2 also introduces the basic concepts that are needed to effectively use the idealized response plots presented in the following chapters.