- Author
- Martin, J. W. | Nguyen, T. | Byrd, E. | Dickens, B. | Embree, N.
- Title
- Laboratory Apparatus and Cumulative Damage Model for Linking Field and Laboratory Exposure Results.
- Coporate
- National Institute of Standards and Technology, Gaithersburg, MD
- Book or Conf
- Service Life Prediction: Methodology and Metrologies. Proceedings. American Chemical Society Symposium Series 805. 2002, American Chemical Society, Martin, J. W.; Bauer, D. R., Editors, 119-143 p., 2002
- Keywords
- equipment | damage | laboratories | exposure | temperature | humidity | ultraviolet radiation