- Author
-
Lee, E. P.
|
Ohtani, H.
|
Seki, T.
|
Hasegawa, H.
|
Imada, S.
|
Yashiro, I.
- Title
- Study on Short-Circuit Mechanism Due to thermal Degradation of Electrical Cord Covering Based on Defective Thermal Radiation.
- Coporate
- National Research Institute of Fire and Disaster, Tokyo, Japan
Nittan Co., Ltd., Tokyo, Japan
Japan Weather Association, Tokyo, Japan
- Journal
-
Bulletin of Japan Association for Fire Science and Engineering,
Vol. 51,
No. 2,
21-27,
2001
- Keywords
-
electrical fires
|
short circuits
|
thermal radiation
|
thermal degradation