- Author
- Lee, E. P. | Ohtani, H. | Seki, T. | Hasegawa, H. | Imada, S. | Yashiro, I.
- Title
- Study on Short-Circuit Mechanism Due to thermal Degradation of Electrical Cord Covering Based on Defective Thermal Radiation.
- Coporate
- National Research Institute of Fire and Disaster, Tokyo, Japan Nittan Co., Ltd., Tokyo, Japan Japan Weather Association, Tokyo, Japan
- Journal
- Bulletin of Japan Association for Fire Science and Engineering, Vol. 51, No. 2, 21-27, 2001
- Keywords
- electrical fires | short circuits | thermal radiation | thermal degradation