Buck, T. M.; Allen, F. G.; Dalton, J. V.
view article (9.992496)
Detection of Chemical Species by Surface Effects on Metals and Semiconductors.
Bell Telephone Laboratories, Inc., Murray Hill, NJ
Chapter 9; LC Catalog Card No. 65-16173,
Surface Effects in Detection Conference. Proceedings. Sponsored by IIT Research Institute at the Brookings Institution. June 30-July 2, 1964,
Spartan Books, Inc., Washington, DC,
Washington, DC,
Bregman, J. I.; Dravnieks, A., Editors,
147-163 p.,
1965