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Buck, T. M.; Allen, F. G.; Dalton, J. V.
view article (1.0)Detection of Chemical Species by Surface Effects on Metals and Semiconductors.Bell Telephone Laboratories, Inc., Murray Hill, NJ['Chapter 9', 'LC Catalog Card No. 65-16173']Chapter 9; LC Catalog Card No. 65-16173Surface Effects in Detection Conference. Proceedings. Sponsored by IIT Research Institute at the Brookings Institution. June 30-July 2, 1964, Spartan Books, Inc., Washington, DC, Washington, DC, Bregman, J. I.; Dravnieks, A., Editors, 147-163 p., 1965