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LaChance, J. L.; Nowlen, S. P.; Wyant, F. J.; Dandini, V. J.
view article (1.0)Circuit Analysis: Failure Mode and Likelihood Analysis.Sandia National Laboratories, Albuquerque, NM['NUREG/CR-6834', 'SAND2002-1942P']Nuclear Regulatory Commission, Washington, DC, NUREG/CR-6834; SAND2002-1942P
September 2003
221 p.