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• Scierka, S.; Forster, A.; Kosik, W.
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  XPS Study on the Effects of Pigment on the UV Degradation of an Epoxy System.
  National Institute of Standards and Technology, Gaithersburg, MD; Army Research Laboratory, Aberdeen Proving Ground, MD
  Federation of Societies for Coatings Technology (FSCT) Technical Program Annual Meeting, 81st. November 12-14, 2003, Federation of Societies for Coatings Technology, Blue Bell, PA, Philadelphia, PA, 2003

• Chin, J.; Scierka, S.; Kim, T.; Forster, A.
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  Photoconductivity Technique for the Assessment of Pigment Photoreactivity.
  National Institute of Standards and Technology, Gaithersburg, MD
  Federation of Societies for Coatings Technology (FSCT) Technical Program Annual Meeting, 81st. November 12-14, 2003, Federation of Societies for Coatings Technology, Blue Bell, PA, Philadelphia, PA, 2003

• Watson, S. S.; Forster, A.; Tseng, I. H.; Sung, L. P.
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  Assessment of Spectrophotometric Assay Methods on Nanostructured Pigments.
  National Institute of Standards and Technology, Gaithersburg, MD
  ['ACS Symposium Series 1008', 'Chapter 17']
  ACS Symposium Series 1008; Chapter 17
  Nanotechnology Applications in Coatings. American Chemical Society (ACS) Symposium Series 1008. Chapter 17, American Chemical Society, Washington, DC, Fernando, R. H.; Sung, L. P., Editors, 349-372 p., 2009