Scierka, S.; Forster, A.; Kosik, W.
view article (1.0)
XPS Study on the Effects of Pigment on the UV Degradation of an Epoxy System.
National Institute of Standards and Technology, Gaithersburg, MD; Army Research Laboratory, Aberdeen Proving Ground, MD
Federation of Societies for Coatings Technology (FSCT) Technical Program Annual Meeting, 81st. November 12-14, 2003,
Federation of Societies for Coatings Technology, Blue Bell, PA,
Philadelphia, PA,
2003
Chin, J.; Scierka, S.; Kim, T.; Forster, A.
view article (1.0)
Photoconductivity Technique for the Assessment of Pigment Photoreactivity.
National Institute of Standards and Technology, Gaithersburg, MD
Federation of Societies for Coatings Technology (FSCT) Technical Program Annual Meeting, 81st. November 12-14, 2003,
Federation of Societies for Coatings Technology, Blue Bell, PA,
Philadelphia, PA,
2003
Watson, S. S.; Forster, A.; Tseng, I. H.; Sung, L. P.
view article (1.0)
Assessment of Spectrophotometric Assay Methods on Nanostructured Pigments.
National Institute of Standards and Technology, Gaithersburg, MD
ACS Symposium Series 1008; Chapter 17,
Nanotechnology Applications in Coatings. American Chemical Society (ACS) Symposium Series 1008. Chapter 17,
American Chemical Society, Washington, DC,
Fernando, R. H.; Sung, L. P., Editors,
349-372 p.,
2009