Gu, X.; Raghavan, D.; Nguyen, T.; VanLandingham, M. R.
view article (9.081846)
Characterization of Polyester Degradation Using Tapping Mode Atomic Force Microscopy.
Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
Polymeric Materials: Science and Engineering (PMSE) Fall Meeting. Volume 83. Proceedings. American Chemical Society (ACS) Division of Polymeric Materials: Science and Engineering. August 20-24, 2000,
American Chemical Society, Washington, DC,
Washington, DC,
336-337 p.,
2000
Sung, L. P.; Jasmin, J.; Gu, X.; Nguyen, T.; Martin, J. W.
view article (9.081846)
Use of Laser Scanning Confocal Microscopy for Quantitative Characterization of Physical Changes of Polymer Coatings After UV Exposure.
National Institute of Standards and Technology, Gaithersburg, MD
Federation of Societies for Coatings Technology (FSCT) Technical Program Annual Meeting, 81st. November 12-14, 2003,
Federation of Societies for Coatings Technology, Blue Bell, PA,
Philadelphia, PA,
2003
Nguyen, T.; Gu, X.; VanLandingham, M. R.; Ryntz, R.; Nguyen, D.; Martin, J. W.; Nguyen, T.
view article (9.081846)
Nanoscale Chemical Imaging of Polymeric Materials With Atomic Force Microscopy.
National Institute of Standards and Technology, Gaithersburg, MD; Visteon Corp., Dearborn, MI; PPG Industries, Inc., Allison Park, PA
Adhesion Fundamentals: From Moecules to Mechanisms and Modeling. Annual Meeting of the Adhesion Society, 26th. Proceedings. February 23-26, 2003,
Myrtle Beack, SC,
Koberstein, J. T.; Anderson, G. L., Editors,
508-510 p.,
2003
Nguyen, T.; Gu, X.; VanLandingham, M.; Ryntz, R.; Nugyen, D.; Martin, J. W.
view article (9.081846)
Nanoscale Characterization of Coatings Surface Degradation With Tapping Atomic Force Microscopy.
National Institute of Standards and Technology, Gaithersburg, MD; Visteon Corporation, Dearborn, MI; PPG Industries, Inc., Alison Park, PA
Adhesion Fundamentals: From Molecules to Mechanisms and Modeling. Adhesion Society Annual Meeting, 26th. Proceedings. February 23-26, 2003,
Myrtle Beach, SC,
508-510 p.,
2003
Pursch, M.; Vanderhart, D. L.; Sander, L. C.; Gu, X.; Nguyen, T.; Wise, S. A.; Gajewski, D. A.
view article (9.076204)
C30 Self-Assemblied Monolayers on Silica, Titania, and Zirconia: HPLC Performance, Atomic Force Microscopy, Ellipsometry, and NMR Studies of Molecular Dynamcis and Uniformity of Coverage.
Dow Deutschland Inc., Germany; National Institute of Standards and Technology, Gaithersburg, MD
Journal of the American Chemical Society,
Vol. 122,
No. 29,
6997-7011,
2000
Raghavan, D.; Gu, X.; Nguyen, T.; VanLandingham, M. R.
view article (9.076204)
Characterization of Chemical Heterogeneity in Polymer Systems Using Hydrolysis and Tapping-Mode Atomic Force Microscopy.
Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
Journal of Polymer Science: Part B, Polymer Physics,
Vol. 39,
No. 13,
1460-1470,
2001
Gu, X.; Ho, D. L.; Sung, L. P.; VanLandingham, M. R.; Nguyen, T.; Raghavan, D.
view article (9.076204)
Nanocharacterization of Surface and Interface of Different Epoxy Networks.
National Institute of Standards and Technology, Gaithersburg, MD; Howard Univ., Washington, DC
DD Polymer Interfaces and Thin Films. Materials Research Society (MRS) Symposium. Proceedings. Volume 710. 2002,
Karim, A.; Frank, C. W.; Russel, T. P.; Nealey, P. F., Editors,
DD109.1-DD109.6 p.,
2002
Gu, X.; Sung, L. P.; Ho, D. L.; Michaels, C. A.; Nguyen, T.; Nguyen, D.; Jean, Y. C.
view article (9.076204)
Surface and Interface Properties of PVDF/Acrylic Copolymer Blends Before and After UV Exposure.
National Institute of Standards and Technology, Gaithersburg, MD; PPG Industries, Inc., Allison Park, PA; University of Missouri-Kansas City, Kansas City, MO
Global Connectivity. FSCT 80th Annual Meeting Technical Program. Proceedings. October 30-November 1, 2002,
Federation of Socieites for Coatings Technology, Blue Bell, PA,
New Orleans, LA,
2002
Gu, X.; VanLandingham, M. R.; Raghavan, D.; Nguyen, T.
view article (9.06978)
Mapping Heterogeneity in Polymeric Materials Using Atomic Force Microscopy: Phase Imaging and Nanoindentation.
Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
Polymeric Materials: Science and Engineering (PMSE). Spring Meeting. Volume 82. Proceedings. American Chemical Society (ASME). March 26-30, 2000,
American Chemical Society, Washington, DC,
San Francisco, CA,
50-51 p.,
2000
Giraud, M.; Nguyen, T.; Gu, X.; VanLandingham, M. R.
view article (9.06978)
Effects of Stoichiometry and Epoxy Molecular Mass on Wettability and Interfacial Microstructures of Amine-Cured Epoxies.
National Institute of Standards and Technology, Gaithersburg, MD
Adhesion Society Annual Meeting, 24th. Proceedings. February 2001,
Adhesion Society, Blacksburg, VA,
Williamsburg, VA,
Emerson, J. A., Editors,
260-262 p.,
2001