Raghavan, D.; VanLandingham, M. R.; Gu, X.; Nguyen, T.
view article (1.0)
Characterization of Heterogeneous Regions in Polymer Systems Using Tapping Mode and Force Mode Atomic Force Microscopy.
Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
Langmuir,
Vol. 16,
No. 24,
9448-9459,
2000
Raghavan, D.; Gu, X.; Nguyen, T.; VanLandingham, M. R.; Karim, A.
view article (1.0)
Mapping Polymer Heterogeneity Using Atomic Force Microscopy Phase Imaging and Nanoscale Indentation.
Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
Macromolecules,
Vol. 33,
No. 7,
2573-2583,
2000
Raghavan, D.; Gu, X.; VanLandingham, M. R.; Nguyen, T.
view article (1.0)
Mapping Chemically Heterogeneous Polymer System Using Chemical Modification and Atomic Force Microscopy.
Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
ACS Polymer Preprints,
Vol. 41,
No. 2,
1423-1424,
2000
Gu, X.; Raghavan, D.; Nguyen, T.; VanLandingham, M. R.
view article (1.0)
Characterization of Polyester Degradation Using Tapping Mode Atomic Force Microscopy.
Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
Polymeric Materials: Science and Engineering (PMSE) Fall Meeting. Volume 83. Proceedings. American Chemical Society (ACS) Division of Polymeric Materials: Science and Engineering. August 20-24, 2000,
American Chemical Society, Washington, DC,
Washington, DC,
336-337 p.,
2000
Gu, X.; VanLandingham, M. R.; Raghavan, D.; Nguyen, T.
view article (1.0)
Mapping Heterogeneity in Polymeric Materials Using Atomic Force Microscopy: Phase Imaging and Nanoindentation.
Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
Polymeric Materials: Science and Engineering (PMSE). Spring Meeting. Volume 82. Proceedings. American Chemical Society (ASME). March 26-30, 2000,
American Chemical Society, Washington, DC,
San Francisco, CA,
50-51 p.,
2000
Pursch, M.; Vanderhart, D. L.; Sander, L. C.; Gu, X.; Nguyen, T.; Wise, S. A.; Gajewski, D. A.
view article (1.0)
C30 Self-Assemblied Monolayers on Silica, Titania, and Zirconia: HPLC Performance, Atomic Force Microscopy, Ellipsometry, and NMR Studies of Molecular Dynamcis and Uniformity of Coverage.
Dow Deutschland Inc., Germany; National Institute of Standards and Technology, Gaithersburg, MD
Journal of the American Chemical Society,
Vol. 122,
No. 29,
6997-7011,
2000
Raghavan, D.; Gu, X.; Nguyen, T.; VanLandingham, M. R.
view article (1.0)
Characterization of Chemical Heterogeneity in Polymer Systems Using Hydrolysis and Tapping-Mode Atomic Force Microscopy.
Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
Journal of Polymer Science: Part B, Polymer Physics,
Vol. 39,
No. 13,
1460-1470,
2001
Giraud, M.; Nguyen, T.; Gu, X.; VanLandingham, M. R.
view article (1.0)
Effects of Stoichiometry and Epoxy Molecular Mass on Wettability and Interfacial Microstructures of Amine-Cured Epoxies.
National Institute of Standards and Technology, Gaithersburg, MD
Adhesion Society Annual Meeting, 24th. Proceedings. February 2001,
Adhesion Society, Blacksburg, VA,
Williamsburg, VA,
Emerson, J. A., Editors,
260-262 p.,
2001
Nguyen, T.; Gu, X.; VanLandingham, M. R.; Giraud, M.; Dutruc-Rosset, R.; Ryntz, R.; Nguyen, D.
view article (1.0)
Characterization of Coating System Interphases With Phase Imaging AFM.
National Institute of Standards and Technology, Gaithersburg, MD; Visteon Corp., Dearborn, MI; PPG Industries, Inc., Allison Park, PA
Adhesion Society Annual Meeting, 24th. Proceedings. February 2001,
Adhesion Society, Blacksburg, VA,
Williamsburg, VA,
Emerson, J. A., Editors,
68-70 p.,
2001
Gu, X.; Ho, D. L.; Sung, L. P.; VanLandingham, M. R.; Nguyen, T.; Raghavan, D.
view article (1.0)
Nanocharacterization of Surface and Interface of Different Epoxy Networks.
National Institute of Standards and Technology, Gaithersburg, MD; Howard Univ., Washington, DC
DD Polymer Interfaces and Thin Films. Materials Research Society (MRS) Symposium. Proceedings. Volume 710. 2002,
Karim, A.; Frank, C. W.; Russel, T. P.; Nealey, P. F., Editors,
DD109.1-DD109.6 p.,
2002