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  • Raghavan, D.; VanLandingham, M. R.; Gu, X.; Nguyen, T.
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    Characterization of Heterogeneous Regions in Polymer Systems Using Tapping Mode and Force Mode Atomic Force Microscopy.
    Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
    Langmuir, Vol. 16, No. 24, 9448-9459, 2000

  • Raghavan, D.; Gu, X.; Nguyen, T.; VanLandingham, M. R.; Karim, A.
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    Mapping Polymer Heterogeneity Using Atomic Force Microscopy Phase Imaging and Nanoscale Indentation.
    Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
    Macromolecules, Vol. 33, No. 7, 2573-2583, 2000

  • Raghavan, D.; Gu, X.; VanLandingham, M. R.; Nguyen, T.
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    Mapping Chemically Heterogeneous Polymer System Using Chemical Modification and Atomic Force Microscopy.
    Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
    ACS Polymer Preprints, Vol. 41, No. 2, 1423-1424, 2000

  • Gu, X.; Raghavan, D.; Nguyen, T.; VanLandingham, M. R.
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    Characterization of Polyester Degradation Using Tapping Mode Atomic Force Microscopy.
    Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
    Polymeric Materials: Science and Engineering (PMSE) Fall Meeting. Volume 83. Proceedings. American Chemical Society (ACS) Division of Polymeric Materials: Science and Engineering. August 20-24, 2000, American Chemical Society, Washington, DC, Washington, DC, 336-337 p., 2000

  • Gu, X.; VanLandingham, M. R.; Raghavan, D.; Nguyen, T.
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    Mapping Heterogeneity in Polymeric Materials Using Atomic Force Microscopy: Phase Imaging and Nanoindentation.
    Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
    Polymeric Materials: Science and Engineering (PMSE). Spring Meeting. Volume 82. Proceedings. American Chemical Society (ASME). March 26-30, 2000, American Chemical Society, Washington, DC, San Francisco, CA, 50-51 p., 2000

  • Pursch, M.; Vanderhart, D. L.; Sander, L. C.; Gu, X.; Nguyen, T.; Wise, S. A.; Gajewski, D. A.
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    C30 Self-Assemblied Monolayers on Silica, Titania, and Zirconia: HPLC Performance, Atomic Force Microscopy, Ellipsometry, and NMR Studies of Molecular Dynamcis and Uniformity of Coverage.
    Dow Deutschland Inc., Germany; National Institute of Standards and Technology, Gaithersburg, MD
    Journal of the American Chemical Society, Vol. 122, No. 29, 6997-7011, 2000

  • Raghavan, D.; Gu, X.; Nguyen, T.; VanLandingham, M. R.
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    Characterization of Chemical Heterogeneity in Polymer Systems Using Hydrolysis and Tapping-Mode Atomic Force Microscopy.
    Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
    Journal of Polymer Science: Part B, Polymer Physics, Vol. 39, No. 13, 1460-1470, 2001

  • Giraud, M.; Nguyen, T.; Gu, X.; VanLandingham, M. R.
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    Effects of Stoichiometry and Epoxy Molecular Mass on Wettability and Interfacial Microstructures of Amine-Cured Epoxies.
    National Institute of Standards and Technology, Gaithersburg, MD
    Adhesion Society Annual Meeting, 24th. Proceedings. February 2001, Adhesion Society, Blacksburg, VA, Williamsburg, VA, Emerson, J. A., Editors, 260-262 p., 2001

  • Nguyen, T.; Gu, X.; VanLandingham, M. R.; Giraud, M.; Dutruc-Rosset, R.; Ryntz, R.; Nguyen, D.
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    Characterization of Coating System Interphases With Phase Imaging AFM.
    National Institute of Standards and Technology, Gaithersburg, MD; Visteon Corp., Dearborn, MI; PPG Industries, Inc., Allison Park, PA
    Adhesion Society Annual Meeting, 24th. Proceedings. February 2001, Adhesion Society, Blacksburg, VA, Williamsburg, VA, Emerson, J. A., Editors, 68-70 p., 2001

  • Gu, X.; Ho, D. L.; Sung, L. P.; VanLandingham, M. R.; Nguyen, T.; Raghavan, D.
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    Nanocharacterization of Surface and Interface of Different Epoxy Networks.
    National Institute of Standards and Technology, Gaithersburg, MD; Howard Univ., Washington, DC
    DD Polymer Interfaces and Thin Films. Materials Research Society (MRS) Symposium. Proceedings. Volume 710. 2002, Karim, A.; Frank, C. W.; Russel, T. P.; Nealey, P. F., Editors, DD109.1-DD109.6 p., 2002