McNesby, K. L.; Skaggs, R. R.; Morris, J. B.; Kennedy, B.; Miziolek, A. W.; Jackson, W. M.; McLaren, I. A.
view article (1.0)
Diodie Laser-Based Sensor for Fast Measurement of Binary Gas Mixtures.
Army Research Laboratory, Aberdeen Proving Ground, MD; University of California-Davis, CA; McLaren Research, Mountain View, CA
Halon Options Technical Working Conference. Proceedings. HOTWC 1999. April 27-29, 1999,
Albuquerque, NM,
191-200 p.,
1999
McNesby, K. L.; Daniel, R. G.; Miziolek, A. W.; Wainner, R. T.; Jackson, W. M.; McLaren, I. A.
view article (1.0)
Diode Laser-Based Equivalence Ratio Measurement. [ABSTRACT ONLY]
Army Research Laboratory, Aberdeen Proving Ground, MD; California Univ., Davis; McLaren Research, Mountain View, CA
Halon Options Technical Working Conference. Proceedings. HOTWC 2000. Sponsored by: University of New Mexico, Fire Suppression Systems Assoc., Fire and Safety Group, Great Lakes Chemical Corp., Halon Alternative Research Corp., Hughes Associates, Inc., Kidde Fenwal, Inc., Kidde International, Modular Protection, Inc., Next Generation Fire Suppression Technology Program, Sandia National Laboratories, Summit Environmental Corp., Inc. and 3M Specialty Materials. May 2-4, 2000,
Albuquerque, NM,
334-334 p.,
2000
McNesby, K. L.; Wainner, R. T.; Miziolek, A. W.; Jackson, W. M.; McLaren, I. A.
view article (1.0)
Detection and Measurement of Middle Distillate Fuel Vapors Using Tunable Diode Lasers.
Army Research Laboratory, Aberdeen Proving Ground, MD; California Univ., Davis; McLaren Research, Mountain View, CA
Halon Options Technical Working Conference. Proceedings. HOTWC 2000. Sponsored by: University of New Mexico, Fire Suppression Systems Assoc., Fire and Safety Group, Great Lakes Chemical Corp., Halon Alternative Research Corp., Hughes Associates, Inc., Kidde Fenwal, Inc., Kidde International, Modular Protection, Inc., Next Generation Fire Suppression Technology Program, Sandia National Laboratories, Summit Environmental Corp., Inc. and 3M Specialty Materials. May 2-4, 2000,
Albuquerque, NM,
456-463 p.,
2000