Gu, X.; VanLandingham, M. R.; Fasolka, M.; Martin, J. W.; Jean, J. Y.; Nguyen, T.
view article (1.0)
Enhancing Sensitivity of Atomic Force Microscopy for Characterization of Surface Chemical Heterogeneity.
National Institute of Standards and Technology, Gaithersburg, MD; University of Missouri-Kansas City, MO
Adhesion Fundamentals: From Moecules to Mechanisms and Modeling. Annual Meeting of the Adhesion Society, 26th. Proceedings. February 23-26, 2003,
Myrtle Beack, SC,
Koberstein, J. T.; Anderson, G. L., Editors,
185-187 p.,
2003