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  • Chin, J.; Scierka, S.; Kim, T.; Forster, A.
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    Photoconductivity Technique for the Assessment of Pigment Photoreactivity.
    National Institute of Standards and Technology, Gaithersburg, MD
    Federation of Societies for Coatings Technology (FSCT) Technical Program Annual Meeting, 81st. November 12-14, 2003, Federation of Societies for Coatings Technology, Blue Bell, PA, Philadelphia, PA, 2003

  • Kranendonk, L. A.; Walewski, J. W.; Kim, T.; Sanders, S. T.
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    Wavelength-Agile Sensor Applied for HCCI Engine Measurements.
    Wisconsin-Madison Univ., WI
    Combustion Institute, Symposium (International) on Combustion, 30th. Proceedings. Volume 30. Part 1. July 25-30, 2004, Combustion Institute, Pittsburgh, PA, Chicago, IL, Chen, J. H.; Colket, M. D.; Barlow, R. S.; Yetter, R. A., Editors, 1619-1627 p., 2005