LaChance, J. L.; Nowlen, S. P.; Wyant, F. J.; Dandini, V. J.
view article (1.0)
Circuit Analysis: Failure Mode and Likelihood Analysis.
Sandia National Laboratories, Albuquerque, NM
Nuclear Regulatory Commission, Washington, DC,
NUREG/CR-6834; SAND2002-1942P,
September 2003,
221 p.