Gu, X.; Sung, L. P.; Ho, D. L.; Michaels, C. A.; Nguyen, D.; Jean, Y. C.; Nguyen, T.
view article (10.004545)
Surface and Interface Properties of UV-Exposed PVDF/PMMA-CO-PEA Blends.
National Institute of Standards and Technology, Gaithersburg, MD; University of Missouri-Kansas City, MO; PPG Industries, Inc., Allison Park, PA
Adhesion Fundamentals: From Moecules to Mechanisms and Modeling. Annual Meeting of the Adhesion Society, 26th. Proceedings. February 23-26, 2003,
Myrtle Beack, SC,
Koberstein, J. T.; Anderson, G. L., Editors,
505-507 p.,
2003
Nguyen, T.; Gu, X.; VanLandingham, M. R.; Ryntz, R.; Nguyen, D.; Martin, J. W.; Nguyen, T.
view article (9.9981365)
Nanoscale Chemical Imaging of Polymeric Materials With Atomic Force Microscopy.
National Institute of Standards and Technology, Gaithersburg, MD; Visteon Corp., Dearborn, MI; PPG Industries, Inc., Allison Park, PA
Adhesion Fundamentals: From Moecules to Mechanisms and Modeling. Annual Meeting of the Adhesion Society, 26th. Proceedings. February 23-26, 2003,
Myrtle Beack, SC,
Koberstein, J. T.; Anderson, G. L., Editors,
508-510 p.,
2003
Gu, X.; VanLandingham, M. R.; Fasolka, M.; Martin, J. W.; Jean, J. Y.; Nguyen, T.
view article (9.993612)
Enhancing Sensitivity of Atomic Force Microscopy for Characterization of Surface Chemical Heterogeneity.
National Institute of Standards and Technology, Gaithersburg, MD; University of Missouri-Kansas City, MO
Adhesion Fundamentals: From Moecules to Mechanisms and Modeling. Annual Meeting of the Adhesion Society, 26th. Proceedings. February 23-26, 2003,
Myrtle Beack, SC,
Koberstein, J. T.; Anderson, G. L., Editors,
185-187 p.,
2003