Kim, J. H.; Mulholland, G. W.; Kukuck, S. R.; Pui, D. Y. H.
view article (9.993612)
Slip Correction Measurements of Certified PSL Nanoparticles Using a Nanometer Differential Mobility Analyzer (Nano-DMA) for Knudsen Number From 0.5 to 83.
Minnesota Univ., MN; National Institute of Standards and Technology, Gaithersburg, MD
Journal of Research of the National Institute of Standards and Technology,
Vol. 110,
No. 1,
31-54,
January/February 2005