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• Raghavan, D.; VanLandingham, M. R.; Gu, X.; Nguyen, T.
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  Characterization of Heterogeneous Regions in Polymer Systems Using Tapping Mode and Force Mode Atomic Force Microscopy.
  Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
  Langmuir, Vol. 16, No. 24, 9448-9459, 2000

• Raghavan, D.; Gu, X.; Nguyen, T.; VanLandingham, M. R.; Karim, A.
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  Mapping Polymer Heterogeneity Using Atomic Force Microscopy Phase Imaging and Nanoscale Indentation.
  Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
  Macromolecules, Vol. 33, No. 7, 2573-2583, 2000