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• Stutzman, P. E.; Clifton, J. R.
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  Specimen Preparation for Scanning Electron Microscopy.
  National Institute of Standards and Technology, Gaithersburg, MD
  Cement Microscopy, 21st International Conference. Proceedings. April 25-29, 1999, Las Vegas, NV, Jany, L.; Nisperos, A., Editors, 10-22 p., 1999