Stutzman, P. E.; Clifton, J. R.
view article (9.986072)
Specimen Preparation for Scanning Electron Microscopy.
National Institute of Standards and Technology, Gaithersburg, MD
Cement Microscopy, 21st International Conference. Proceedings. April 25-29, 1999,
Las Vegas, NV,
Jany, L.; Nisperos, A., Editors,
10-22 p.,
1999