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• Gu, X.; VanLandingham, M. R.; Fasolka, M.; Martin, J. W.; Jean, J. Y.; Nguyen, T.
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  Enhancing Sensitivity of Atomic Force Microscopy for Characterization of Surface Chemical Heterogeneity.
  National Institute of Standards and Technology, Gaithersburg, MD; University of Missouri-Kansas City, MO
  Adhesion Fundamentals: From Moecules to Mechanisms and Modeling. Annual Meeting of the Adhesion Society, 26th. Proceedings. February 23-26, 2003, Myrtle Beack, SC, Koberstein, J. T.; Anderson, G. L., Editors, 185-187 p., 2003

• Nguyen, T.; Gu, X.; VanLandingham, M. R.; Ryntz, R.; Nguyen, D.; Martin, J. W.; Nguyen, T.
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  Nanoscale Chemical Imaging of Polymeric Materials With Atomic Force Microscopy.
  National Institute of Standards and Technology, Gaithersburg, MD; Visteon Corp., Dearborn, MI; PPG Industries, Inc., Allison Park, PA
  Adhesion Fundamentals: From Moecules to Mechanisms and Modeling. Annual Meeting of the Adhesion Society, 26th. Proceedings. February 23-26, 2003, Myrtle Beack, SC, Koberstein, J. T.; Anderson, G. L., Editors, 508-510 p., 2003

• Nguyen, T.; Gu, X.; VanLandingham, M.; Ryntz, R.; Nugyen, D.; Martin, J. W.
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  Nanoscale Characterization of Coatings Surface Degradation With Tapping Atomic Force Microscopy.
  National Institute of Standards and Technology, Gaithersburg, MD; Visteon Corporation, Dearborn, MI; PPG Industries, Inc., Alison Park, PA
  Adhesion Fundamentals: From Molecules to Mechanisms and Modeling. Adhesion Society Annual Meeting, 26th. Proceedings. February 23-26, 2003, Myrtle Beach, SC, 508-510 p., 2003