FireDOC Search

displaying 1 - 1 results in total 1

• Gu, X.; VanLandingham, M. R.; Fasolka, M.; Martin, J. W.; Jean, J. Y.; Nguyen, T.
  view article (1.0)

  Enhancing Sensitivity of Atomic Force Microscopy for Characterization of Surface Chemical Heterogeneity.
  National Institute of Standards and Technology, Gaithersburg, MD; University of Missouri-Kansas City, MO
  Adhesion Fundamentals: From Moecules to Mechanisms and Modeling. Annual Meeting of the Adhesion Society, 26th. Proceedings. February 23-26, 2003, Myrtle Beack, SC, Koberstein, J. T.; Anderson, G. L., Editors, 185-187 p., 2003