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  • Chang, Y. M.; Rorrer, D. E.
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    Example of a Numeric and Alphanumeric Technique for Conversion From a Small-Scale Computer to a Large-Scale Computer.
    National Bureau of Standards, Washington, DC
    Department of Housing and Urban Development, Washington, DC, NBSIR 77-1206, February 1977, 24 p.

  • Nguyen, T.; Byrd, W. E.; Bentz, D. P.
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    Quantifying Water at the Organic Film/Hydroxylated Substrate Interface.
    National Institute of Standards and Technology, Gaithersburg, MD
    Journal of Adhesion, Vol. 48, 169-194, 1995

  • Nguyen, T.; Byrd, W. E.; Bentz, D. P.; Seiler, J. F., Jr.
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    Development of a Method for Measuring Water-Stripping Resistance of Asphalt/Siliceous Aggregate Mixtures.
    National Institute of Standards and Technology, Gaithersburg, MD
    National Research Council, Washington, DC, NISTIR 5865, July 1996, 49 p.

  • Nguyen, T.; Byrd, W. E.; Alsheh, D.; Aouadi, K.; Chin, J. W.
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    Water at the Polymer/Substrate Interface and Its Role in the Durability of Polymer/Glass Fiber Composites.
    National Institute of Standards and Technology, Gaithersburg, MD
    Durability of Fibre Reinforced Polymer (FRP) Composites for Construction (CDCC'98), 1st International Conference. Proceedings. August 1998, Canada, Benmokrane, B.; Rahman, H., Editors, 451-462 p., 1998

  • Lin, C. J.; Du, R. G.; Nguyen, T.
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    In-Situ Imaging of Chloride Ions at the Metal/Solution Interface by Scanning Combination Microelectrodes.
    Xiamen University, China; National Institute of Standards and Technology, Gaithersburg, MD
    Corrosion, Vol. 56, No. 1, 41-47, January 2000

  • Nguyen, T.; Gu, X.; VanLandingham, M. R.; Giraud, M.; Dutruc-Rosset, R.; Ryntz, R.; Nguyen, D.
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    Characterization of Coating System Interphases With Phase Imaging AFM.
    National Institute of Standards and Technology, Gaithersburg, MD; Visteon Corp., Dearborn, MI; PPG Industries, Inc., Allison Park, PA
    Adhesion Society Annual Meeting, 24th. Proceedings. February 2001, Adhesion Society, Blacksburg, VA, Williamsburg, VA, Emerson, J. A., Editors, 68-70 p., 2001