Lin, C. J.; Du, R. G.; Nguyen, T.
view article (9.993612)
In-Situ Imaging of Chloride Ions at the Metal/Solution Interface by Scanning Combination Microelectrodes.
Xiamen University, China; National Institute of Standards and Technology, Gaithersburg, MD
Corrosion,
Vol. 56,
No. 1,
41-47,
January 2000