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• Gu, X.; VanLandingham, M. R.; Fasolka, M.; Martin, J. W.; Jean, J. Y.; Nguyen, T.
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  Enhancing Sensitivity of Atomic Force Microscopy for Characterization of Surface Chemical Heterogeneity.
  National Institute of Standards and Technology, Gaithersburg, MD; University of Missouri-Kansas City, MO
  Adhesion Fundamentals: From Moecules to Mechanisms and Modeling. Annual Meeting of the Adhesion Society, 26th. Proceedings. February 23-26, 2003, Myrtle Beack, SC, Koberstein, J. T.; Anderson, G. L., Editors, 185-187 p., 2003

• Gu, X.; Nguyen, T.; Sung, L. P.; Ho, D. L.; Vanlandingham, M. R.; Jean, Y. C.; Martin, J. W.
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  Advanced Techniques for Nanocharacterization of Polymeric Coating Surfaces.
  National Institute of Standards and Technology, Gaithersburg, MD; University of Missouri-Kansas City; Army Research Laboratory, Aberdeen Proving Ground, MD
  Federation of Societies for Coatings Technology (FSCT) Technical Program Annual Meeting, 81st. November 12-14, 2003, Federation of Societies for Coatings Technology, Blue Bell, PA, Philadelphia, PA, 2003