FireDOC Search

displaying 1 - 4 results in total 4

• Raghavan, D.; VanLandingham, M. R.; Gu, X.; Nguyen, T.
  view article (1.0)

  Characterization of Heterogeneous Regions in Polymer Systems Using Tapping Mode and Force Mode Atomic Force Microscopy.
  Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
  Langmuir, Vol. 16, No. 24, 9448-9459, 2000

• Gu, X.; VanLandingham, M. R.; Fasolka, M.; Martin, J. W.; Jean, J. Y.; Nguyen, T.
  view article (1.0)

  Enhancing Sensitivity of Atomic Force Microscopy for Characterization of Surface Chemical Heterogeneity.
  National Institute of Standards and Technology, Gaithersburg, MD; University of Missouri-Kansas City, MO
  Adhesion Fundamentals: From Moecules to Mechanisms and Modeling. Annual Meeting of the Adhesion Society, 26th. Proceedings. February 23-26, 2003, Myrtle Beack, SC, Koberstein, J. T.; Anderson, G. L., Editors, 185-187 p., 2003

• Nguyen, T.; Gu, X.; VanLandingham, M. R.; Ryntz, R.; Nguyen, D.; Martin, J. W.; Nguyen, T.
  view article (1.0)

  Nanoscale Chemical Imaging of Polymeric Materials With Atomic Force Microscopy.
  National Institute of Standards and Technology, Gaithersburg, MD; Visteon Corp., Dearborn, MI; PPG Industries, Inc., Allison Park, PA
  Adhesion Fundamentals: From Moecules to Mechanisms and Modeling. Annual Meeting of the Adhesion Society, 26th. Proceedings. February 23-26, 2003, Myrtle Beack, SC, Koberstein, J. T.; Anderson, G. L., Editors, 508-510 p., 2003

• Nguyen, T.; Gu, X.; VanLandingham, M.; Ryntz, R.; Nugyen, D.; Martin, J. W.
  view article (1.0)

  Nanoscale Characterization of Coatings Surface Degradation With Tapping Atomic Force Microscopy.
  National Institute of Standards and Technology, Gaithersburg, MD; Visteon Corporation, Dearborn, MI; PPG Industries, Inc., Alison Park, PA
  Adhesion Fundamentals: From Molecules to Mechanisms and Modeling. Adhesion Society Annual Meeting, 26th. Proceedings. February 23-26, 2003, Myrtle Beach, SC, 508-510 p., 2003