Gu, X.; Raghavan, D.; Nguyen, T.; VanLandingham, M. R.
view article (9.9981365)
Characterization of Polyester Degradation Using Tapping Mode Atomic Force Microscopy.
Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
Polymeric Materials: Science and Engineering (PMSE) Fall Meeting. Volume 83. Proceedings. American Chemical Society (ACS) Division of Polymeric Materials: Science and Engineering. August 20-24, 2000,
American Chemical Society, Washington, DC,
Washington, DC,
336-337 p.,
2000
Raghavan, D.; Gu, X.; Nguyen, T.; VanLandingham, M. R.
view article (9.992496)
Characterization of Chemical Heterogeneity in Polymer Systems Using Hydrolysis and Tapping-Mode Atomic Force Microscopy.
Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
Journal of Polymer Science: Part B, Polymer Physics,
Vol. 39,
No. 13,
1460-1470,
2001
Gu, X.; VanLandingham, M. R.; Raghavan, D.; Nguyen, T.
view article (9.986072)
Mapping Heterogeneity in Polymeric Materials Using Atomic Force Microscopy: Phase Imaging and Nanoindentation.
Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
Polymeric Materials: Science and Engineering (PMSE). Spring Meeting. Volume 82. Proceedings. American Chemical Society (ASME). March 26-30, 2000,
American Chemical Society, Washington, DC,
San Francisco, CA,
50-51 p.,
2000
Raghavan, D.; Gu, X.; Nguyen, T.; VanLandingham, M. R.; Karim, A.
view article (9.3113985)
Mapping Polymer Heterogeneity Using Atomic Force Microscopy Phase Imaging and Nanoscale Indentation.
Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
Macromolecules,
Vol. 33,
No. 7,
2573-2583,
2000
Raghavan, D.; Gu, X.; VanLandingham, M. R.; Nguyen, T.
view article (9.3113985)
Mapping Chemically Heterogeneous Polymer System Using Chemical Modification and Atomic Force Microscopy.
Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
ACS Polymer Preprints,
Vol. 41,
No. 2,
1423-1424,
2000
Nguyen, T.; Gu, X.; VanLandingham, M. R.; Giraud, M.; Dutruc-Rosset, R.; Ryntz, R.; Nguyen, D.
view article (9.3113985)
Characterization of Coating System Interphases With Phase Imaging AFM.
National Institute of Standards and Technology, Gaithersburg, MD; Visteon Corp., Dearborn, MI; PPG Industries, Inc., Allison Park, PA
Adhesion Society Annual Meeting, 24th. Proceedings. February 2001,
Adhesion Society, Blacksburg, VA,
Williamsburg, VA,
Emerson, J. A., Editors,
68-70 p.,
2001