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• Raghavan, D.; Gu, X.; Nguyen, T.; VanLandingham, M. R.; Karim, A.
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  Mapping Polymer Heterogeneity Using Atomic Force Microscopy Phase Imaging and Nanoscale Indentation.
  Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
  Macromolecules, Vol. 33, No. 7, 2573-2583, 2000

• Raghavan, D.; Gu, X.; VanLandingham, M. R.; Nguyen, T.
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  Mapping Chemically Heterogeneous Polymer System Using Chemical Modification and Atomic Force Microscopy.
  Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
  ACS Polymer Preprints, Vol. 41, No. 2, 1423-1424, 2000

• Gu, X.; Raghavan, D.; Nguyen, T.; VanLandingham, M. R.
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  Characterization of Polyester Degradation Using Tapping Mode Atomic Force Microscopy.
  Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
  Polymeric Materials: Science and Engineering (PMSE) Fall Meeting. Volume 83. Proceedings. American Chemical Society (ACS) Division of Polymeric Materials: Science and Engineering. August 20-24, 2000, American Chemical Society, Washington, DC, Washington, DC, 336-337 p., 2000

• Gu, X.; VanLandingham, M. R.; Raghavan, D.; Nguyen, T.
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  Mapping Heterogeneity in Polymeric Materials Using Atomic Force Microscopy: Phase Imaging and Nanoindentation.
  Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
  Polymeric Materials: Science and Engineering (PMSE). Spring Meeting. Volume 82. Proceedings. American Chemical Society (ASME). March 26-30, 2000, American Chemical Society, Washington, DC, San Francisco, CA, 50-51 p., 2000

• Raghavan, D.; Gu, X.; Nguyen, T.; VanLandingham, M. R.
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  Characterization of Chemical Heterogeneity in Polymer Systems Using Hydrolysis and Tapping-Mode Atomic Force Microscopy.
  Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
  Journal of Polymer Science: Part B, Polymer Physics, Vol. 39, No. 13, 1460-1470, 2001

• Nguyen, T.; Gu, X.; VanLandingham, M. R.; Giraud, M.; Dutruc-Rosset, R.; Ryntz, R.; Nguyen, D.
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  Characterization of Coating System Interphases With Phase Imaging AFM.
  National Institute of Standards and Technology, Gaithersburg, MD; Visteon Corp., Dearborn, MI; PPG Industries, Inc., Allison Park, PA
  Adhesion Society Annual Meeting, 24th. Proceedings. February 2001, Adhesion Society, Blacksburg, VA, Williamsburg, VA, Emerson, J. A., Editors, 68-70 p., 2001