Scierka, S.; Forster, A.; Kosik, W.
view article (1.0)
XPS Study on the Effects of Pigment on the UV Degradation of an Epoxy System.
National Institute of Standards and Technology, Gaithersburg, MD; Army Research Laboratory, Aberdeen Proving Ground, MD
Federation of Societies for Coatings Technology (FSCT) Technical Program Annual Meeting, 81st. November 12-14, 2003,
Federation of Societies for Coatings Technology, Blue Bell, PA,
Philadelphia, PA,
2003
Chin, J.; Scierka, S.; Kim, T.; Forster, A.
view article (1.0)
Photoconductivity Technique for the Assessment of Pigment Photoreactivity.
National Institute of Standards and Technology, Gaithersburg, MD
Federation of Societies for Coatings Technology (FSCT) Technical Program Annual Meeting, 81st. November 12-14, 2003,
Federation of Societies for Coatings Technology, Blue Bell, PA,
Philadelphia, PA,
2003