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• Scierka, S.; Forster, A.; Kosik, W.
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  XPS Study on the Effects of Pigment on the UV Degradation of an Epoxy System.
  National Institute of Standards and Technology, Gaithersburg, MD; Army Research Laboratory, Aberdeen Proving Ground, MD
  Federation of Societies for Coatings Technology (FSCT) Technical Program Annual Meeting, 81st. November 12-14, 2003, Federation of Societies for Coatings Technology, Blue Bell, PA, Philadelphia, PA, 2003

• Chin, J.; Scierka, S.; Kim, T.; Forster, A.
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  Photoconductivity Technique for the Assessment of Pigment Photoreactivity.
  National Institute of Standards and Technology, Gaithersburg, MD
  Federation of Societies for Coatings Technology (FSCT) Technical Program Annual Meeting, 81st. November 12-14, 2003, Federation of Societies for Coatings Technology, Blue Bell, PA, Philadelphia, PA, 2003