displaying 1 - 1 results in total 1
Kim, J. H.; Mulholland, G. W.; Kukuck, S. R.; Pui, D. Y. H.
view article (1.0)Slip Correction Measurements of Certified PSL Nanoparticles Using a Nanometer Differential Mobility Analyzer (Nano-DMA) for Knudsen Number From 0.5 to 83.Minnesota Univ., MN; National Institute of Standards and Technology, Gaithersburg, MDJournal of Research of the National Institute of Standards and Technology, Vol. 110, No. 1, 31-54, January/February 2005