Bentz, D. P.; Stutzman, P. E.; Haecker, C. J.; Remond, S.
view article (10.004545)
SEM/X-Ray Imaging of Cement-Based Materials.
National Institute of Standards and Technology, Gaithersburg, MD; Wilhelm Dyckerhoff Institut, Wiesbaden, Germany; Centre Scientifique et Technique du Batiment, France
Microscopy Applied to Building Materials, 7th Euroseminar. Proceedings. June 29-July 2, 1999,
Delft University of Technology, Delft, The Netherlands,
Delft, The Netherlands,
Pietersen, H. S.; Larbi, J. A.; Janssen, H. H. A., Editors,
457-466 p.,
1999