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• Bentz, D. P.; Stutzman, P. E.; Haecker, C. J.; Remond, S.
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  SEM/X-Ray Imaging of Cement-Based Materials.
  National Institute of Standards and Technology, Gaithersburg, MD; Wilhelm Dyckerhoff Institut, Wiesbaden, Germany; Centre Scientifique et Technique du Batiment, France
  Microscopy Applied to Building Materials, 7th Euroseminar. Proceedings. June 29-July 2, 1999, Delft University of Technology, Delft, The Netherlands, Delft, The Netherlands, Pietersen, H. S.; Larbi, J. A.; Janssen, H. H. A., Editors, 457-466 p., 1999