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• Bentz, D. P.; Feng, X.; Haecker, C. J.; Stutzman, P. E.
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  Analysis of CCRL Proficiency Cements 135 and 136 Using CEMHYD3D.
  National Institute of Standards and Technology, Gaithersburg, MD
  NISTIR 6545
  NISTIR 6545
  August 2000
  23 p.