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  • Odler, I.; Stutzman, P.
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    Texture of Mature Tricalcium Silicate and Portland Cement Pastes as Studied by Scanning Electron Microscopy.
    Technical Univ., Clausthal, Germany; National Institute of Standards and Technology, Gaithersburg, MD
    International Cement Microscopy Association. International Conference on Cement Microscopy, 14th. April 5-9, 1992, Intl. Cement Microscopy Assoc., Duncanville, TX, Costa Mesa, CA, Gouda,G. R.; Nisperos, A.; Bayles, J., Editors, 449-461 p., 1992

  • Bentz, D. P.; Stutzman, P. E.; Haecker, C. J.; Remond, S.
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    SEM/X-Ray Imaging of Cement-Based Materials.
    National Institute of Standards and Technology, Gaithersburg, MD; Wilhelm Dyckerhoff Institut, Wiesbaden, Germany; Centre Scientifique et Technique du Batiment, France
    Microscopy Applied to Building Materials, 7th Euroseminar. Proceedings. June 29-July 2, 1999, Delft University of Technology, Delft, The Netherlands, Delft, The Netherlands, Pietersen, H. S.; Larbi, J. A.; Janssen, H. H. A., Editors, 457-466 p., 1999

  • Stutzman, P. E.; Clifton, J. R.
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    Specimen Preparation for Scanning Electron Microscopy.
    National Institute of Standards and Technology, Gaithersburg, MD
    Cement Microscopy, 21st International Conference. Proceedings. April 25-29, 1999, Las Vegas, NV, Jany, L.; Nisperos, A., Editors, 10-22 p., 1999