FireDOC Search

displaying 71 - 80 results in total 140

  • Mulholland, G. W.; Bohren, C. F.; Fuller, K. A.
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    Light Scattering by Agglomerates: Coupled Electric and Magnetic Dipole Method.
    National Institute of Standards and Technology, Gaithersburg, MD; Pennsylvania State Univ., University Park; Colorado State Univ., Fort Collins
    Langmuir, Vol. 10, No. 8, 2533-2546, 1994
    National Science Foundation, Washington, DC; National Park Service, Washington, DC; National Aeronautics and Space Administration, Washington, DC,

  • Choi, M. Y.; Mulholland, G. W.; Hamins, A.; Kashiwagi, T.
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    Experimental Study of the Optical Properties of Soot and Smoke.
    University of Illinois, Chicago; National Institute of Standards and Technology, Gaithersburg, MD
    NISTIR 5499
    NISTIR 5499
    September 1994
    National Institute of Standards and Technology. Annual Conference on Fire Research: BOOK OF ABSTRACTS. October 17-20, 1994, Gaithersburg, MD, 123-124 p., 1994

  • Mulholland, G. W.; Babrauskas, V.; Parker, W. J.; Twilley, W. H.
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    PHI-Meter: A Fuel-Independent Instrument for Monitoring Combustion Equivalence Ratio.
    National Institute of Standards and Technology, Gaithersburg, MD
    NISTIR 5499
    NISTIR 5499
    September 1994
    National Institute of Standards and Technology. Annual Conference on Fire Research: BOOK OF ABSTRACTS. October 17-20, 1994, Gaithersburg, MD, 159-160 p., 1994

  • Leonard, S.; Mulholland, G. W.; Puri, R.; Santoro, R. J.
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    Generation of CO and Smoke During Underventilated Combustion.
    Pennsylvania State Univ., University Park; National Institute of Standards and Technology, Gaithersburg, MD
    Combustion and Flame, Vol. 98, 20-34, 1994

  • Choi, M. Y.; Hamins, A.; Mulholland, G. W.; Kashiwagi, T.
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    Simultaneous Optical Measurement of Soot Volume Fraction and Temperature in Premixed Flames.
    University of Illinois, Chicago; National Institute of Standards and Technology, Gaithersburg, MD
    Combustion and Flame, Vol. 99, 174-186, 1994

  • Choi, M. Y.; Mulholland, G. W.; Hamins, A.; Kashiwagi, T.
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    Comparisons of the Soot Volume Fraction Using Gravimetric and Light Extinction Techniques.
    National Institute of Standards and Technology, Gaithersburg, MD
    Combustion and Flame, Vol. 102, No. 1/2, 161-169, July 1995

  • Pitts, W. M.; Mulholland, G. W.; Breuel, B. D.; Johnsson, E. L.; Chung, S.; Harris, R. H., Jr.; Hess, D. E.
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    Real-Time Suppressant Concentration Measurement.
    National Institute of Standards and Technology, Gaithersburg, MD
    ['NIST SP 890', 'Volume 2', 'Section 11']
    NIST SP 890; Volume 2; Section 11
    November 1995
    Fire Suppression System Performance of Alternative Agents in Aircraft Engine and Dry Bay Laboratory Simulations. Volume 2, Gann, R. G., Editors, 319-590 p., 1995

  • Mulholland, G. W.
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    Smoke Production and Properties.
    National Institute of Standards and Technology, Gaithersburg, MD
    ['NFPA SFPE 95', 'LC Card Number 95-68247']
    NFPA SFPE 95; LC Card Number 95-68247
    SFPE Handbook of Fire Protection Engineering. 2nd Edition. Section 2. Chapter 15, National Fire Protection Assoc., Quincy, MA, DiNenno, P. J.; Beyler, C. L.; Custer, R. L. P.; Walton, W. D.; Watts, J. M., Jr.; Drysdale, D.; Hall, J. R., Jr., Editors, 2/217-227 p., 1995

  • Mulholland, G. W.; Bryner, N. P.; Liggett, W.; Scheer, B. W.; Goodall, R. K.
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    Selection of Calibration Particles for Scanning Surface Inspection Systems.
    National Institute of Standards and Technology, Gaithersburg, MD; VLSI Standards, Inc., San Jose, CA; International 300 mm Initiative, Austin, TX
    Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays. International Society for Optical Engineering (SPIE). Proceedings. Volume 2862. August 8-9, 1996, Society of Photo-Optical Instrument Engineers, WA, Denver, CO, 104-118 p., 1996

  • Childs, K. D.; Narum, D.; LaVanier, L. A.; Lindley, P. M.; Schueler, B. W.; Mulholland, G. W.; Diebold, A. C.
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    Comparison of Submicron Particle Analysis by Auger Electron Spectroscopy, Time-of-Flight Secondary Ion Mass Spectrometry, and Secondary Electron Microscopy With Energy Dispersive X-Ray Spectroscopy.
    Physical Electronics Inc., Eden Prairie, MN; Charles Evans and Associates, Redwood City, CA; Physical Electronics Inc., Redwood City, CA; National Institute of Standards and Technology, Gaithersburg, MD; Sematech, Austin, TX
    Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films, Vol. 14, No. 4, 2392-2404, July/August 1996