- Author
-
Fischer, R. M.
|
Ketola, W. D.
|
Martin, J.
|
Jorgensen, G.
|
Mertzel, E.
|
Pernisz, U.
|
Zerlaut,G.
- Title
- Accelerated Life Testing of Devices With S/S, S/L, and S/G Interfaces.
- Coporate
- 3M Co., St. Paul, MN
National Institute of Standards and Technology, Gaithersburg, MD
National Renewable Energy Lab.
Goodrich (B. F.) Co., Avon Lake, OH
Dow Chemical, Midland, MI
SC-International Inc.
- Journal
-
Critical Reviews in Surface Chemistry,
Vol. 2,
No. 4,
311-321,
1993
- Keywords
-
devices
|
service life
|
weather effects
|
degradation
|
climate
- Abstract
- A new approach for predicting service life for today's more durable materials exposed in an exterior weathering environment is proposed. Five priorities were identified and discussed: (1) adopt a new service life prediction methodology for weathering environments, (2) develop appropriate models for predicting "real" service life from accelerated tests, (3) quantify the stresses in exterior environments, (4) define and understand degradation mechanisms and their relationship to weathering stresses, (5) establish data bases for quantified climatic stresses and material responses to these stresses.