- Author
-
VanLandingham, M. R.
|
Villarrubia, J. S.
|
Meyers, G. F.
- Title
- Nanoidentation of Polymers: Overview.
- Coporate
- National Institute of Standards and Technology, Gaithersburg, MD
Dow Chemical Company, Midland, MI
- Journal
-
ACS Polymer Preprints,
Vol. 41,
No. 2,
1412-1413,
2000
- Keywords
-
microscopy
|
blind reconstruction
|
mechanical properties
|
nanoindentation
|
tip shape calibration
|
polymers
- Identifiers
- Atomic Force Microscopy (AFM)
- Abstract
- Indentation measurements made with atomic force microscopy (AFM) probes are relative measurements, largely due to the lack of information regarding the tip shape of the AFM probes. Also, current tip shape calibration procedures used in depth-sensing indentation rely on indentation results from a reference material, and the reproducibility of these methods has been poor in a recent interlaboratory comparison. In this paper, a technique referred to as blind reconstruction is used as a material-independent method for characterizing the tip shapes of probes used with the AFM to indent polymeric materials. Results using this method are compared to results of a material-dependent tip shape analysis, particularly with regard to experimental uncertainties.