Gilman, J. W.; Kashiwagi, T.; Morgan, A. B.; Harris, R. H., Jr.; Brassell, L. D.; VanLandingham, M. R.; Jackson, C. L.
view article (1.0)
Flammability of Polymer Clay Nanocomposites Consortium: Year One Annual Report.
National Institute of Standards and Technology, Gaithersburg, MD
NISTIR 6531,
July 2000,
55 p.
Morgan, A. B.; Antonucci, J. M.; VanLandingham, M. R.; Harris, R. H., Jr.; Kashiwagi, T.
view article (1.0)
Thermal and Flammability Properties of a Silica-PMMA Nanocomposites.
National Institute of Standards and Technology, Gaithersburg, MD
Polymeric Materials Science and Engineering,
Vol. 83,
57-58,
2000
Raghavan, D.; VanLandingham, M. R.; Gu, X.; Nguyen, T.
view article (1.0)
Characterization of Heterogeneous Regions in Polymer Systems Using Tapping Mode and Force Mode Atomic Force Microscopy.
Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
Langmuir,
Vol. 16,
No. 24,
9448-9459,
2000
Raghavan, D.; Gu, X.; Nguyen, T.; VanLandingham, M. R.; Karim, A.
view article (1.0)
Mapping Polymer Heterogeneity Using Atomic Force Microscopy Phase Imaging and Nanoscale Indentation.
Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
Macromolecules,
Vol. 33,
No. 7,
2573-2583,
2000
VanLandingham, M. R.; Villarrubia, J. S.; Meyers, G. F.
view article (1.0)
Nanoidentation of Polymers: Overview.
National Institute of Standards and Technology, Gaithersburg, MD; Dow Chemical Company, Midland, MI
ACS Polymer Preprints,
Vol. 41,
No. 2,
1412-1413,
2000
Raghavan, D.; Gu, X.; VanLandingham, M. R.; Nguyen, T.
view article (1.0)
Mapping Chemically Heterogeneous Polymer System Using Chemical Modification and Atomic Force Microscopy.
Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
ACS Polymer Preprints,
Vol. 41,
No. 2,
1423-1424,
2000
VanLandingham, M. R.; Villarrubia, J. S.; Meyers, G. F.
view article (1.0)
Recent Progress in Nanoscale Indentation of Polymers Using the AFM.
National Institute of Standards and Technology, Gaithersburg, MD; Dow Chemical Company, Midland, MI
SEM IX International Congress on Experimental Mechanics. Proceedings. Society for Experimental Mechanics. June 5-8, 2000,
Orlando, FL,
912-915 p.,
2000
VanLandingham, M. R.; Villarrubia, J. S.; Meyers, G. F.; Dineen, M.
view article (1.0)
Advancing Nanoscale Indentation Measurements Toward Quantitative Characterization of Polymer Properties.
National Institute of Standards and Technology, Gaithersburg, MD; Dow Chemical Company, Midland, MI
Microscopy and Microanalysis,
Vol. 6,
No. Suppl. 2:Proceedings,
1108-1109,
2000
Gu, X.; Raghavan, D.; Nguyen, T.; VanLandingham, M. R.
view article (1.0)
Characterization of Polyester Degradation Using Tapping Mode Atomic Force Microscopy.
Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
Polymeric Materials: Science and Engineering (PMSE) Fall Meeting. Volume 83. Proceedings. American Chemical Society (ACS) Division of Polymeric Materials: Science and Engineering. August 20-24, 2000,
American Chemical Society, Washington, DC,
Washington, DC,
336-337 p.,
2000
Gu, X.; VanLandingham, M. R.; Raghavan, D.; Nguyen, T.
view article (1.0)
Mapping Heterogeneity in Polymeric Materials Using Atomic Force Microscopy: Phase Imaging and Nanoindentation.
Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
Polymeric Materials: Science and Engineering (PMSE). Spring Meeting. Volume 82. Proceedings. American Chemical Society (ASME). March 26-30, 2000,
American Chemical Society, Washington, DC,
San Francisco, CA,
50-51 p.,
2000