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Fischer, R. M.; Ketola, W. D.; Martin, J.; Jorgensen, G.; Mertzel, E.; Pernisz, U.; Zerlaut,G.
view article (1.0)Accelerated Life Testing of Devices With S/S, S/L, and S/G Interfaces.3M Co., St. Paul, MN; National Institute of Standards and Technology, Gaithersburg, MD; National Renewable Energy Lab.; Goodrich (B. F.) Co., Avon Lake, OH; Dow Chemical, Midland, MI; SC-International Inc.Critical Reviews in Surface Chemistry, Vol. 2, No. 4, 311-321, 1993