Fischer, R. M.; Ketola, W. D.; Martin, J.; Jorgensen, G.; Mertzel, E.; Pernisz, U.; Zerlaut,G.
view article (10.004545)
Accelerated Life Testing of Devices With S/S, S/L, and S/G Interfaces.
3M Co., St. Paul, MN; National Institute of Standards and Technology, Gaithersburg, MD; National Renewable Energy Lab.; Goodrich (B. F.) Co., Avon Lake, OH; Dow Chemical, Midland, MI; SC-International Inc.
Critical Reviews in Surface Chemistry,
Vol. 2,
No. 4,
311-321,
1993