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displaying 11 - 20 results in total 25

  • Sung, L. P.; Jasmin, J.; Gu, X.; Nguyen, T.; Martin, J. W.
    view article (9.06978)

    Use of Laser Scanning Confocal Microscopy for Characterizing Changes in Film Thickness and Local Surface Morphology of UV Exposed Polymer Coatings.
    National Institute of Standards and Technology, Gaithersburg, MD
    Journal of Coatings Technology Research, Vol. 1, No. 4, 267-276, 2004

  • Gu, X.; Sung, L. P.; Kidah, B.; Oudina, M.; Martin, D.; Rezig, Z.; Stanley, D.; Jean, J. Y. C.; Nguyen, T.; Martin, J. W.
    view article (9.06978)

    Relating Gloss Loss to Nanoscale/Microscale Topographical Change for a Polymer Coating Exposed to UV Radiation.
    National Institute of Standards and Technology, Gaithersburg, MD; University of Missouri at Kansas City, Kansas City, MO
    ACS Symposium Series 1008; Chapter 16,
    Nanotechnology Applications in Coatings. American Chemical Society (ACS) Symposium Series 1008. Chapter 16, American Chemical Society, Washington, DC, Fernando, R. H.; Sung, L. P., Editors, 328-348 p., 2009

  • Raghavan, D.; VanLandingham, M. R.; Gu, X.; Nguyen, T.
    view article (8.74085)

    Characterization of Heterogeneous Regions in Polymer Systems Using Tapping Mode and Force Mode Atomic Force Microscopy.
    Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
    Langmuir, Vol. 16, No. 24, 9448-9459, 2000

  • Jean, Y. C.; Mallon, P. E.; Zhang, R.; Chen, H.; Li, Y.; Zhang, J.; Wu, Y. C.; Sandreczki, T. C.; Suzuki, R.; Ohdaira, T.; Gu, X.; Nguyen, T.
    view article (8.74085)

    Positron Studies of Polymeric Coatings.
    University of Missouri-Kansas City, MO; University of Stellenbosch, Matieland, South Africa; National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan; National Institute of Standards and Technology, Gaithersburg, MD
    Radiation Physics and Chemistry, Vol. 68, No. 3/4, 395-402, October/November 2003

  • Gu, X.; Raghavan, D.; Douglas, J. F.; Karim, A.
    view article (8.74085)

    Hole Growth Instability in the Dewetting of Evaporating Polymer Solution Films.
    Howard University, Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
    Journal of Polymer Science: Part B: Polymer Physics, Vol. 40, No. 24, 2825-2832, December 15, 2002

  • Gu, X.; VanLandingham, M. R.; Fasolka, M.; Martin, J. W.; Jean, J. Y.; Nguyen, T.
    view article (8.74085)

    Enhancing Sensitivity of Atomic Force Microscopy for Characterization of Surface Chemical Heterogeneity.
    National Institute of Standards and Technology, Gaithersburg, MD; University of Missouri-Kansas City, MO
    Adhesion Fundamentals: From Moecules to Mechanisms and Modeling. Annual Meeting of the Adhesion Society, 26th. Proceedings. February 23-26, 2003, Myrtle Beack, SC, Koberstein, J. T.; Anderson, G. L., Editors, 185-187 p., 2003

  • Gu, X.; Nguyen, T.; Sung, L. P.; Ho, D. L.; Vanlandingham, M. R.; Jean, Y. C.; Martin, J. W.
    view article (8.74085)

    Advanced Techniques for Nanocharacterization of Polymeric Coating Surfaces.
    National Institute of Standards and Technology, Gaithersburg, MD; University of Missouri-Kansas City; Army Research Laboratory, Aberdeen Proving Ground, MD
    Federation of Societies for Coatings Technology (FSCT) Technical Program Annual Meeting, 81st. November 12-14, 2003, Federation of Societies for Coatings Technology, Blue Bell, PA, Philadelphia, PA, 2003

  • Gu, X.; Nguyen, T.; Ho, D. L.; Oudina, M.; Martin, D.; Kidah, B.; Jamin, J.; Rezig, A.; Sung, L. P.; Byrd, E.; Martin, J. W.; Jean, Y. C.
    view article (8.74085)

    Microstructure and Morphology of Amine-Cured Epoxy Coatings and Their Changes With Outdoor Exposures: An AFM Study.
    National Institute of Standards and Technology, Gaithersburg, MD; Missouri Univ., Kansas City
    Journal of Coatings Technology Research, Vol. 1, No. 3, 2004

  • Raghavan, D.; Gu, X.; Nguyen, T.; VanLandingham, M. R.; Karim, A.
    view article (8.618251)

    Mapping Polymer Heterogeneity Using Atomic Force Microscopy Phase Imaging and Nanoscale Indentation.
    Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
    Macromolecules, Vol. 33, No. 7, 2573-2583, 2000

  • Raghavan, D.; Gu, X.; VanLandingham, M. R.; Nguyen, T.
    view article (8.618251)

    Mapping Chemically Heterogeneous Polymer System Using Chemical Modification and Atomic Force Microscopy.
    Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
    ACS Polymer Preprints, Vol. 41, No. 2, 1423-1424, 2000