Sung, L. P.; Drzal, P. L.; VanLandingham, M. R.; Wu, T. Y.
view article (8.49406)
Metrology for Characterizing Sratch Resistance of Polymer Coatings.
National Institute of Standards and Technology, Gaithersburg, MD; National Taiwan Univ., Taipei
Annual Meeting, 82nd. Federation of Societies for Coatings Technology Meeting Technical Program. Federation of Societies for Coatings Technology (FSCT) Meeting. Proceedings. October 27-29, 2004,
Federation of Societies for Coatings Technology, Blue Bell, PA,
Chicago, IL,
2004
Sung, L. P.; Mulholland, G. W.; Germer, T. A.
view article (8.481994)
Polarization of Light Scattered by Particles on Silicon Wafers.
National Institute of Standards and Technology, Gaithersburg, MD; Maryland Univ., College Park
Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays. Proceedings. SPIE Proceedings Series Volume 3619. Society of Photyo-Optical Instrumentation Engineers (SPIE). January 28, 1999,
Society of Photo-Optical Instrumentation Engineers, Bellingham, WA,
San Jose, CA,
80-89 p.,
1999
Sung, L. P.; Mulholland, G. W.; Germer, T. A.
view article (8.481994)
Polarized Light-Scattering Measurements of Dielectric Spheres Upon a Silicon Surface.
Maryland Univ., College Park; National Institute of Standards and Technology, Gaithersburg, MD
Optics Letters,
Vol. 24,
No. 13,
866-868,
July 1, 1999
Air-Conditioning and Refrigeration Technology Institute, Arlington, VA,
Jeng, U.; Liua, W. J.; Lin, T. L.; Tsao, C. S.; Cantennwala, T.; Chiang, L. Y.; Sung, L. P.; Han, C. C.
view article (8.481994)
Sans and Saxs Study on Aqueous Mixtures of Fullerene-Based Star Ionomers and Sodium Dodecyl Sulfate.
National Tsing Hua Univ., Hsinchu, Taiwan; Institute of Nuclear Energy Research, Lungtan, Taiwan; National Taiwan Univ., Taipei, Taiwan; National Institute of Standards and Technology, Gaithersburg, MD
Physica A: A Statistical Mechanics and Its Application,
Vol. 304,
191-201,
2002
Sung, L. P.; Karim, A.; Douglas, J. F.; Han, C. C.
view article (8.481994)
Dimensional Crossover in the Phase Separation Kinetics of Thin Polymer Blend Films.
National Institute of Standards and Technology, Gaithersburg, MD
Physical Review Letters,
Vol. 76,
No. 23,
4368-4371,
June 3, 1996
Chong, K. P.; VanLandingham, M. R.; Sung, L. P.
view article (8.481994)
Advances in Materials and Mechanics.
National Science Foundation, Arlington, VA; National Institute of Standards and Technology, Gaithersburg, MD
Advances in Building Technology International Conference. December 4-6, 2002,
Hong Kong, China,
3-16 p.,
2002
VanLandingham, M. R.; Sung, L. P.; Chang, N. K.; Wu, T. Y.; Chang, S. H.; Jardret, V. D.
view article (8.481994)
Measurement Approaches to Develop a Fundamental Understanding of Scratch and Mar Resistance.
Army Research Laboratory, Aberdeen Proving Ground, MD; National Institute of Standards and Technology, Gaithersburg, MD; National Taiwan Univ., Taipei; Tribometrix Inc., Knoxville, TN
Journal of Coatings Technology Research,
Vol. 1,
No. 4,
257-266,
2004
Sung, L. P.; Jasmin, J.; Gu, X.; Nguyen, T.; Martin, J. W.
view article (8.481994)
Use of Laser Scanning Confocal Microscopy for Characterizing Changes in Film Thickness and Local Surface Morphology of UV Exposed Polymer Coatings.
National Institute of Standards and Technology, Gaithersburg, MD
Journal of Coatings Technology Research,
Vol. 1,
No. 4,
267-276,
2004
Gu, X.; Sung, L. P.; Kidah, B.; Oudina, M.; Martin, D.; Rezig, Z.; Stanley, D.; Jean, J. Y. C.; Nguyen, T.; Martin, J. W.
view article (8.481994)
Relating Gloss Loss to Nanoscale/Microscale Topographical Change for a Polymer Coating Exposed to UV Radiation.
National Institute of Standards and Technology, Gaithersburg, MD; University of Missouri at Kansas City, Kansas City, MO
ACS Symposium Series 1008; Chapter 16,
Nanotechnology Applications in Coatings. American Chemical Society (ACS) Symposium Series 1008. Chapter 16,
American Chemical Society, Washington, DC,
Fernando, R. H.; Sung, L. P., Editors,
328-348 p.,
2009
Salamat, G.; deVries, R.; Kaler, E. W.; Satija, S.; Sung, L. P.
view article (8.299797)
Undulations in Salt-Free Charged Lamellar Phases Detected by Small Angle Neutron Scattering and Neutron Reflectivity.
University of Delaware, Newark; National Institute of Standards and Technology, Gaithersburg, MD
Langmuir,
Vol. 16,
No. 1,
102-107,
2000