- Author
- VanLandingham, M. R. | Villarrubia, J. S. | Meyers, G. F. | Dineen, M.
- Title
- Advancing Nanoscale Indentation Measurements Toward Quantitative Characterization of Polymer Properties.
- Coporate
- National Institute of Standards and Technology, Gaithersburg, MD Dow Chemical Company, Midland, MI
- Journal
- Microscopy and Microanalysis, Vol. 6, No. Suppl. 2:Proceedings, 1108-1109, 2000
- Keywords
- elastic modulus | force mode | tip shape calibration | material properties
- Identifiers
- Atomic Force Microscope (AFM)
- Abstract
- The ultimate objective of instrumented indentation testing is to obtain absolute measurements of material properties and behavior. To achieve this goal, accurate knowledge of the shape of the indenter tip is required. For indentation measurements involving sub-micrometer scale contacts, accurate knowledge of the tip shape can be difficult to achieve. In this paper, a technique referred to as blind reconstruction is applied to the measurement of tip shapes of indenters used with the atomic force microscope to indent polymeric materials.