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• VanLandingham, M. R.; Villarrubia, J. S.; Meyers, G. F.
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  Nanoidentation of Polymers: Overview.
  National Institute of Standards and Technology, Gaithersburg, MD; Dow Chemical Company, Midland, MI
  ACS Polymer Preprints, Vol. 41, No. 2, 1412-1413, 2000

• VanLandingham, M. R.; Villarrubia, J. S.; Meyers, G. F.
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  Recent Progress in Nanoscale Indentation of Polymers Using the AFM.
  National Institute of Standards and Technology, Gaithersburg, MD; Dow Chemical Company, Midland, MI
  SEM IX International Congress on Experimental Mechanics. Proceedings. Society for Experimental Mechanics. June 5-8, 2000, Orlando, FL, 912-915 p., 2000

• VanLandingham, M. R.; Villarrubia, J. S.; Meyers, G. F.; Dineen, M.
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  Advancing Nanoscale Indentation Measurements Toward Quantitative Characterization of Polymer Properties.
  National Institute of Standards and Technology, Gaithersburg, MD; Dow Chemical Company, Midland, MI
  Microscopy and Microanalysis, Vol. 6, No. Suppl. 2:Proceedings, 1108-1109, 2000

• VanLandingham, M. R.; Villarrubia, J. S.; Guthrie, W. F.; Meyers, G. F.
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  Nanoindentation of Polymers: An Overview.
  National Institute of Standards and Technology, Gaithersburg, MD; Dow Chemical Co., Midland, MI
  Advances in Scanning Probe Microscopy of Polymers. Macromolecular Symposia. Volume 167. Proceedings. 2001, Tsukruk, V. V.; Spencer, N. D., Editors, 15-44 p., 2001