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• Raghavan, D.; VanLandingham, M. R.; Gu, X.; Nguyen, T.
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  Characterization of Heterogeneous Regions in Polymer Systems Using Tapping Mode and Force Mode Atomic Force Microscopy.
  Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
  Langmuir, Vol. 16, No. 24, 9448-9459, 2000

• Raghavan, D.; Gu, X.; Nguyen, T.; VanLandingham, M. R.; Karim, A.
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  Mapping Polymer Heterogeneity Using Atomic Force Microscopy Phase Imaging and Nanoscale Indentation.
  Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
  Macromolecules, Vol. 33, No. 7, 2573-2583, 2000

• VanLandingham, M. R.; Villarrubia, J. S.; Meyers, G. F.
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  Nanoidentation of Polymers: Overview.
  National Institute of Standards and Technology, Gaithersburg, MD; Dow Chemical Company, Midland, MI
  ACS Polymer Preprints, Vol. 41, No. 2, 1412-1413, 2000

• Raghavan, D.; Gu, X.; VanLandingham, M. R.; Nguyen, T.
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  Mapping Chemically Heterogeneous Polymer System Using Chemical Modification and Atomic Force Microscopy.
  Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
  ACS Polymer Preprints, Vol. 41, No. 2, 1423-1424, 2000

• VanLandingham, M. R.; Villarrubia, J. S.; Meyers, G. F.
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  Recent Progress in Nanoscale Indentation of Polymers Using the AFM.
  National Institute of Standards and Technology, Gaithersburg, MD; Dow Chemical Company, Midland, MI
  SEM IX International Congress on Experimental Mechanics. Proceedings. Society for Experimental Mechanics. June 5-8, 2000, Orlando, FL, 912-915 p., 2000

• Gu, X.; Raghavan, D.; Nguyen, T.; VanLandingham, M. R.
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  Characterization of Polyester Degradation Using Tapping Mode Atomic Force Microscopy.
  Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
  Polymeric Materials: Science and Engineering (PMSE) Fall Meeting. Volume 83. Proceedings. American Chemical Society (ACS) Division of Polymeric Materials: Science and Engineering. August 20-24, 2000, American Chemical Society, Washington, DC, Washington, DC, 336-337 p., 2000

• Gu, X.; VanLandingham, M. R.; Raghavan, D.; Nguyen, T.
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  Mapping Heterogeneity in Polymeric Materials Using Atomic Force Microscopy: Phase Imaging and Nanoindentation.
  Howard Univ., Washington, DC; National Institute of Standards and Technology, Gaithersburg, MD
  Polymeric Materials: Science and Engineering (PMSE). Spring Meeting. Volume 82. Proceedings. American Chemical Society (ASME). March 26-30, 2000, American Chemical Society, Washington, DC, San Francisco, CA, 50-51 p., 2000

• Vali, H.; Hesse, R.; Martin, R. F.
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  TEM-Based Definition of 2:1 Layer Silicates and Their Interstratified Constituents.
  McGill Univ., Quebec, Canada
  American Mineralogist, Vol. 79, 644-653, 1994

• Cetin, K.; Huff, W. D.
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  Characterization of Untreated and Alkylammonium Ion Exchange Illite/Smectite by High Resolution Transmission electron Microscopy.
  Cincinnati Univ., OH
  Clays and Clay Minerals, Vol. 43, No. 3, 337-345, 1995

• Stutzman, P. E.; Bright, D. S.; Garboczi, E. J.
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  Finite Element Stress Computations Applied to Images of Damaged Concrete: A Possible New Diagnostic Tool for Concrete Petrography.
  National Institute of Standards and Technology, Gaithersburg, MD
  Cement Microscopy, 23nd International Conference. Proceedings. April 29-May 4, 2001, Albuquerque, NM, 352-365 p., 2001